SMART OEE

Our SMART System captures EVERY PART in Real Time, (including Time of Test, Bin, XY, Test Time, Index Time, etc.) with millisecond accuracy.
Two Ways to Capture Data DEVICE BY DEVICE!:
      Hardware, sBox snoops ALL Tester/Equipment Interfaces device by device.
      Software, TMD (Tester Monitoring Daemon), snoops handler logs and Tester
       STDF files AS they are being written.

pcFIRMS STDF data analysis software

pcFIRMS provides both simple and advanced analysis of semiconductor manufacturing data. Based on a solid relational database, pcFIRMS let’s you quickly produce full color, illustrated reports on your manufacturing processes.

FIRMS DataPipeline Server

The FIRMS DataPipeline provides data collection and management capabilities for the entire semiconductor manufacturing process. Proven 24/7 reliability, virtually unlimited scalability, and easy administration, combine to provide a convenient way to collect, store, access, and use the large quantities of data generated by Wafer Fabrication, Probe, Assembly, and ATE equipment in your factories in a cost effective manner.

SMART Products pcFIRMS Data Analysis Software FIRMS DataPipeline Server Download & Support Area